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Valerik Vardanyan
Position: Manager II at Synopsys, senior research associate

Phone: (+374 91) 918357, (+374 10) 249868
E-mail: valery_vardanian@yahoo.com




  Research Interests

Boolean functions, test & repair of memory devices

 
  Education

Yerevan State University 1975-1980, Postgraduate courses at NAS Armenia, 1981-1983

 
  Titles, Degree

PhD in Mathematical Cybernetics (1987)

 
  Professional Experience

Institute of Informatics& Automation Problems, 1983-2000 (full-time), 2000-present (part-time)

Virage Logic Inc. Yerevan Branch, 2000-2011

Synopsys Inc., Armenia, 2011- present

Yerevan State University, 2000-present (part-time) 
 
  Selected Publications
В. А. Варданян, “О сложности тестов активностей для частичных булевых функций”, Автоматика и телемеханика, Москва, Изд-во Наука, # 7, стр. 118-124, 1986.

В. А. Варданян, “О сложности единичных динамических тестов для монотонных булевых функций”, “Кибернетика”, Киев, Изд-во “Наукова думка”, # 3, стр. 23-26, 1987.

В. А. Варданян, “Об одном методе синтеза легко тестируемых схем”, Автоматика и телемеханика, Москва, Изд-во Наука, # 7, стр. 136-139, 1987.

В. А. Варданян, “О сложности динамических тестов для функций к-значной логики”, “Кибернетика”, Киев, Изд-во “Наукова думка”, # 3, стр. 29-36, 1988.

Shoukourian, V. A. Vardanian, Y. Zorian, SoC yield optimization via an embedded memory test and repair infrastructure, IEEE Design & Test of Computers, vol.21, May-June, 2004, pp. 200-207.

Y. Zorian, G. Torjyan, A. Harutyunyan, V. Vardanian, Apparatus, method, and system to allocate redundant components with subsets of the redundant components, US Patent, No. 7,149,921, USA, 2006.

G. Harutunyan, V. A. Vardanian, Y. Zorian, “Minimal March Tests for Dynamic Faults in Random Access Memories”, Journal of Electronic Testing: Theory and Applications, Vol. 23, Number 1, February 2007, pp. 55-74 (in English). 

Aleksanyan  K., Amirkhanyan K., Shoukourian S., Vardanian V., Zorian Y., “Memory Modeling Using an Intermediate Level Structural Description”, US Patent, No 7768840, USA, 2010.

K. Aleksanyan, V. A. Vardanian, Y. Zorian, “Various methods and apparatuses for effective yield enhancement of good chip dies having memories per wafer”, US Patent No. 7890900, USA, 2011. 

A. Hakhumyan, G. Harutyunyan, S. Shoukourian, V.A. Vardanian, Y. Zorian, “Symmetry Measure for Memory Test and Its Application in BIST Optimization”, Journal of Electronic Testing : Theory and Applications (JETTA), 2011 , Vol. 27, No. 6, pp.753-766. 

Alexanyan K., Amirkhanyan K., Karapetyan S., Shoukourian S., Shubat A., Vardanian V., Zorian Y., “Various methods and apparatuses for memory modeling using a structural primitive verification for memory compilers”, US Patent No. 8,112,730, 2012.

G. Harutyunyan, S. Shoukourian, V. Vardanian, Y. Zorian, “A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs”, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 31, No. 6, June 2012, pp. 941-949.

K. Alexanyan, V.A. Vardanian, Y. Zorian, “Various Methods and Apparatuses for Effective Yield Enhancement of Good Chip Dies Having Memories Per Wafer”, US Patent No. 8,359,553, 2013.-18 p.

K. Amirkhanyan, H. Grigoryan, G. Harutyunyan, T. Melkumyan, S. Shoukourian,  A. Shubat,  V. Vardanian, Y. Zorian, Detecting Random Telegraph Noise Induced Failures In An Electronic Memory, US Patent 8,850,277, 2014.

H. Grigoryan, G. Harutyunyan, S. Shoukourian, V. Vardanian, Y. Zorian, Determining a desirable number of segments for a multi-segment single error correcting coding scheme, US Patent No. 9,053,050, 2015.


 
News
2019թ. մարտի 19-ին ժ. 11:30-12:30-ը
Ինֆորմատիկայի և ավտոմատացման պրոբլեմների ինստիտուտում (2-րդ հարկ, 209 սենյակ) անցկացվելու է դասախոսություն հետևալ թեմայով. Introduction to Information Retrieval (information retrieval and its basic concepts; current challenges of information retrieval).

Զեկուցողն է Թուլուզի Ինֆորմատիկայի հետազոտությունների ինստիտուտի (IRIT) պրոֆեսոր Ժոզիան Մոթեն (Josiane Mothe):

Բոլոր ցանկացողները հրավիրվում են մասնակցելու:



On March 19, 2019 at 14:00

Seminar of Department for Information theory and statistical models  will be held on the topic: "Information-Theoretic Investigation of Community Detection Problems and Recommender Framework Development". Reporter: PhD student Karen Mkhitaryan.



2019թ. մարտի 21-ին ժ. 14:00-16:00-ը
Ինֆորմատիկայի և ավտոմատացման պրոբլեմների ինստիտուտում անցկացվելու է գիտական սեմինար հետևալ թեմայով. "Lessons learnt from the FabSpace 2.0 experience (FabSpace 2.0 concepts, carried on activities, lessons learnt). FabSpace is an open-innovation network for geodata-based innovation – by leveraging Space data in particular in Universities 2.0. It is a one-stop shop-access to Space data and a wide range of other data as well as free software and data processing tools to develop new digital applications".

Զեկուցողն է` Թուլուզի Ինֆորմատիկայի հետազոտությունների ինստիտուտի (IRIT) պրոֆեսոր Ժոզիան Մոթեն (Josiane Mothe):



                                                           
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