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Valerik Vardanyan
Position: Manager II at Synopsys, senior research associate

Phone: (+374 91) 918357, (+374 10) 249868
E-mail: valery_vardanian@yahoo.com




  Titles, Degree

PhD in Mathematical Cybernetics (1987)

 
  Education

Yerevan State University 1975-1980, Postgraduate courses at NAS Armenia, 1981-1983

 
  Professional Experience

Institute of Informatics& Automation Problems, 1983-2000 (full-time), 2000-present (part-time)

Virage Logic Inc. Yerevan Branch, 2000-2011

Synopsys Inc., Armenia, 2011- present

Yerevan State University, 2000-present (part-time) 
 
  Research Interests

Boolean functions, test & repair of memory devices

 
  Selected Publications
В. А. Варданян, “О сложности тестов активностей для частичных булевых функций”, Автоматика и телемеханика, Москва, Изд-во Наука, # 7, стр. 118-124, 1986.

В. А. Варданян, “О сложности единичных динамических тестов для монотонных булевых функций”, “Кибернетика”, Киев, Изд-во “Наукова думка”, # 3, стр. 23-26, 1987.

В. А. Варданян, “Об одном методе синтеза легко тестируемых схем”, Автоматика и телемеханика, Москва, Изд-во Наука, # 7, стр. 136-139, 1987.

В. А. Варданян, “О сложности динамических тестов для функций к-значной логики”, “Кибернетика”, Киев, Изд-во “Наукова думка”, # 3, стр. 29-36, 1988.

Shoukourian, V. A. Vardanian, Y. Zorian, SoC yield optimization via an embedded memory test and repair infrastructure, IEEE Design & Test of Computers, vol.21, May-June, 2004, pp. 200-207.

Y. Zorian, G. Torjyan, A. Harutyunyan, V. Vardanian, Apparatus, method, and system to allocate redundant components with subsets of the redundant components, US Patent, No. 7,149,921, USA, 2006.

G. Harutunyan, V. A. Vardanian, Y. Zorian, “Minimal March Tests for Dynamic Faults in Random Access Memories”, Journal of Electronic Testing: Theory and Applications, Vol. 23, Number 1, February 2007, pp. 55-74 (in English). 

Aleksanyan  K., Amirkhanyan K., Shoukourian S., Vardanian V., Zorian Y., “Memory Modeling Using an Intermediate Level Structural Description”, US Patent, No 7768840, USA, 2010.

K. Aleksanyan, V. A. Vardanian, Y. Zorian, “Various methods and apparatuses for effective yield enhancement of good chip dies having memories per wafer”, US Patent No. 7890900, USA, 2011. 

A. Hakhumyan, G. Harutyunyan, S. Shoukourian, V.A. Vardanian, Y. Zorian, “Symmetry Measure for Memory Test and Its Application in BIST Optimization”, Journal of Electronic Testing : Theory and Applications (JETTA), 2011 , Vol. 27, No. 6, pp.753-766. 

Alexanyan K., Amirkhanyan K., Karapetyan S., Shoukourian S., Shubat A., Vardanian V., Zorian Y., “Various methods and apparatuses for memory modeling using a structural primitive verification for memory compilers”, US Patent No. 8,112,730, 2012.

G. Harutyunyan, S. Shoukourian, V. Vardanian, Y. Zorian, “A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs”, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol. 31, No. 6, June 2012, pp. 941-949.

K. Alexanyan, V.A. Vardanian, Y. Zorian, “Various Methods and Apparatuses for Effective Yield Enhancement of Good Chip Dies Having Memories Per Wafer”, US Patent No. 8,359,553, 2013.-18 p.

K. Amirkhanyan, H. Grigoryan, G. Harutyunyan, T. Melkumyan, S. Shoukourian,  A. Shubat,  V. Vardanian, Y. Zorian, Detecting Random Telegraph Noise Induced Failures In An Electronic Memory, US Patent 8,850,277, 2014.

H. Grigoryan, G. Harutyunyan, S. Shoukourian, V. Vardanian, Y. Zorian, Determining a desirable number of segments for a multi-segment single error correcting coding scheme, US Patent No. 9,053,050, 2015.


 
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We are pleased to announce that in the frame of the All4R&D project's second open call 26 courses in 6 categories are offered, as well as 4 innovative practices, free of charge. The courses are tailored-made, based on the assessed needs of students and professionals, and trends in the industry. The courses are co-created and are offered in joint collaboration of academic and business organizations from 6 countries (Armenia, Bosnia and Herzegovina, North Macedonia, Germany, Finland, and Austria).

All courses will be in English and employ innovative teaching methods.
Click here for more information.


Open Call for the participation of Young Researchers and Companies in Research projects

We are pleased to announce that the NPUA/IIAP Cooperative R&D Unit has open calls for researchers, MS/Ph.D students, and companies in two new international research projects:
  • Astronomical Objects Classification
  • Performance Optimization System for Hadoop and Spark Frameworks.
We are inviting all the interested parties to participate in these projects.
For more information please follow the link: http://platform.all4rd.net/index.php/2021/02/19/open-call-for-participation-of-young-researchers-and-companies-in-research-projects-3/.



                                                           
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  • Phone: (+37410) 28-20-30
  • Fax: (+37410) 28-20-50
  • E-mail: ipia@ipia.sci.am
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